Tests and proofs : 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, proceedings / Virgile Prevosto, Cristina Seceleanu, editors.
TAP (Conference) (17th : 2023 : Leicester, England); Prevosto, Virgile, editor.; Seceleanu, Cristina, editor.
2023
QA76.758
Available Online

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Title Tests and proofs : 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, proceedings / Virgile Prevosto, Cristina Seceleanu, editors.
Meeting Name TAP (Conference) (17th : 2023 : Leicester, England)
ISBN 9783031388286 (electronic bk.)
3031388283 (electronic bk.)
9783031388279
DOI https://doi.org/10.1007/978-3-031-38828-6
Published Cham : Springer, [2023]
Copyright ©2023
Language English
Description 1 online resource (xxii, 187 pages) : illustrations (some color).
Other Standard Identifiers 10.1007/978-3-031-38828-6 doi
Call Number QA76.758
Dewey Decimal Classification 005.1
Summary This book constitutes the proceedings of the 17th International Conference, TAP 2023, as part of STAF 2023, a federation of conferences on Software Technologies, Applications and Foundations, which includes two more conferences besides TAP: ICGT (International Conference on Graph Transformations), and ECMFA (European Conference on Modelling Foundations and Applications) in Leicester, UK, in July 2023. The 8 full papers together with 2 short papers included in this volume were carefully reviewed and selected from 14 submissions. They were organized in topical sections on Low-level Code Verification, Formal Models, Model-based test generation, and Abstraction and Refinement.
Note International conference proceedings.
Bibliography, etc. Note Includes bibliographical references and author index.
Access Note Access limited to authorized users.
Source of Description Online resource; title from PDF title page (SpringerLink, viewed July 26, 2023).
Added Author Prevosto, Virgile, editor.
Seceleanu, Cristina, editor.
Series Lecture notes in computer science ; 14066. 1611-3349
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Low-level Code Verification
Formal Models
Model-based test generation
Abstraction and Refinement.

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