TY  - GEN
N2  - Unlike most available sources that focus on deep neural network (DNN) inference, this book provides readers with a single-source reference on the needs, requirements, and challenges involved with on-device, DNN training semiconductor and SoC design. The authors include coverage of the trends and history surrounding the development of on-device DNN training, as well as on-device training semiconductors and SoC design examples to facilitate understanding. Focuses on the requirements and challenges of on-device deep neural network (DNN) training, rather than DNN inference; Provides guidelines for on-device, DNN training semiconductor or System-on-Chip (SoC) design; Includes on-device training semiconductors and SoC design examples to facilitate understanding.
DO  - 10.1007/978-3-031-34237-0
DO  - doi
AB  - Unlike most available sources that focus on deep neural network (DNN) inference, this book provides readers with a single-source reference on the needs, requirements, and challenges involved with on-device, DNN training semiconductor and SoC design. The authors include coverage of the trends and history surrounding the development of on-device DNN training, as well as on-device training semiconductors and SoC design examples to facilitate understanding. Focuses on the requirements and challenges of on-device deep neural network (DNN) training, rather than DNN inference; Provides guidelines for on-device, DNN training semiconductor or System-on-Chip (SoC) design; Includes on-device training semiconductors and SoC design examples to facilitate understanding.
T1  - On-chip training NPU -- algorithm, architecture and SoC design /
AU  - Han, Donghyeon,
AU  - Yoo, Hoi-Jun,
CN  - TK7895.E42
ID  - 1472320
KW  - Systems on a chip
KW  - Integrated circuits.
KW  - Neural networks (Computer science)
SN  - 9783031342370
SN  - 3031342372
TI  - On-chip training NPU -- algorithm, architecture and SoC design /
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-34237-0
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-34237-0
ER  -