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Table of Contents
Part one: Material Characterization using Photons and Electrons
X-ray diffraction techniques
Micro-photoluminescence (-PL)
Spectroscopy techniques
Electron Microscopy
Part two: Material Characterization using Ions
Rutherford backscattering Spectroscopy
Secondary ion mass spectroscopy
Part three: Electrical Measurements
Electrical Characterization techniques
Part four: Scanning Probe Techniques
Scanning Probe Microscopies (SPMs).
X-ray diffraction techniques
Micro-photoluminescence (-PL)
Spectroscopy techniques
Electron Microscopy
Part two: Material Characterization using Ions
Rutherford backscattering Spectroscopy
Secondary ion mass spectroscopy
Part three: Electrical Measurements
Electrical Characterization techniques
Part four: Scanning Probe Techniques
Scanning Probe Microscopies (SPMs).