TY  - GEN
AB  - This book will provide readers with a good overview of some of the most recent advances in the field of detector technology for gamma-ray imaging, especially as it pertains to new applications. There will be a good mixture of general chapters in both technology and applications in medical imaging and industrial testing. The book will have an in-depth review of the research topics from world-leading specialists in the field. The conversion of the gamma-ray signal into analog/digital value will be covered in some chapters. Some would also provide a review of CMOS chips for gamma-ray image sensors. Covers a broad range of topics, including an introduction to novel gamma imaging technologies; Includes in-depth analysis on how to optimize X-ray detection; Discusses the analysis of electronics for gamma-ray detection.
AU  - Du, Junwei,
AU  - Iniewski, Krzysztof,
CN  - TK8315
DO  - 10.1007/978-3-031-30666-2
DO  - doi
ID  - 1476127
KW  - Imaging systems.
KW  - Gamma rays.
LK  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-30666-2
N2  - This book will provide readers with a good overview of some of the most recent advances in the field of detector technology for gamma-ray imaging, especially as it pertains to new applications. There will be a good mixture of general chapters in both technology and applications in medical imaging and industrial testing. The book will have an in-depth review of the research topics from world-leading specialists in the field. The conversion of the gamma-ray signal into analog/digital value will be covered in some chapters. Some would also provide a review of CMOS chips for gamma-ray image sensors. Covers a broad range of topics, including an introduction to novel gamma imaging technologies; Includes in-depth analysis on how to optimize X-ray detection; Discusses the analysis of electronics for gamma-ray detection.
SN  - 9783031306662
SN  - 303130666X
T1  - Gamma ray imaging :technology and applications /
TI  - Gamma ray imaging :technology and applications /
UR  - https://univsouthin.idm.oclc.org/login?url=https://link.springer.com/10.1007/978-3-031-30666-2
ER  -