001481536 000__ 03019nam\\22006258i\4500
001481536 001__ 1481536
001481536 003__ DLC
001481536 005__ 20231102003252.0
001481536 006__ m\\\\\o\\d\\\\\\\\
001481536 007__ cr\un\nnnunnun
001481536 008__ 230124s2024\\\\flu\\\\\ob\\\\000\0\eng\d
001481536 010__ $$a  2022059393
001481536 020__ $$a9781003390923
001481536 020__ $$a1003390927
001481536 020__ $$z9781032488189
001481536 020__ $$z9781032488196
001481536 040__ $$aNhCcYBP$$cNhCcYBP
001481536 0411_ $$aeng$$hchi
001481536 042__ $$apcc
001481536 050_4 $$aTK7895.E42
001481536 08200 $$a004.2/1$$223/eng/20230313
001481536 1001_ $$aYin, Yongfeng,$$d1978-$$eauthor.
001481536 24010 $$aQianrushi ruanjian xitong ceshi.$$lEnglish
001481536 24510 $$aEmbedded software system testing :$$bautomatic testing solution based on formal method /$$cYongfeng Yin, Bo Jiang ; [translated by Qingran Su, Ruinan Qiu, Yang Guo, Yi Song, Rui Yin].
001481536 263__ $$a2309
001481536 264_1 $$aBoca Raton :$$bCRC Press,$$c2024.
001481536 300__ $$a1 online resource.
001481536 336__ $$atext$$btxt$$2rdacontent
001481536 337__ $$acomputer$$bc$$2rdamedia
001481536 338__ $$aonline resource$$bcr$$2rdacarrier
001481536 500__ $$a"English Version by permission of Beijing Huazhang Graphics & Information Co. Ltd. (China Machine Press)" --T.p. verso.
001481536 504__ $$aIncludes bibliographical references.
001481536 5050_ $$aEmbedded system and software -- Embedded software engineering and quality characteristics -- Embedded software system testing techniques based on formal methods -- Real-time embedded software automation test description technology -- Testing technology of intelligent terminal application software system -- Real-time embedded software system testing environment construction technology -- Case study of real-time embedded software system testing.
001481536 506__ $$aAccess limited to authorized users
001481536 533__ $$aElectronic reproduction.$$bAnn Arbor, MI$$nAvailable via World Wide Web.
001481536 546__ $$aIn English, translated from the Chinese.
001481536 588__ $$aDescription based on print version record and CIP data provided by publisher; resource not viewed.
001481536 650_0 $$aEmbedded computer systems$$xTesting.
001481536 650_0 $$aComputer software$$xTesting.
001481536 655_0 $$aElectronic books
001481536 7001_ $$aJiang, Bo,$$d1981-$$eauthor.
001481536 7001_ $$aSu, Qingran,$$etranslator.
001481536 7001_ $$aQiu, Ruinan,$$etranslator.
001481536 7001_ $$aGuo, Yang$$c(Translator),$$etranslator.
001481536 7001_ $$aSong, Yi$$c(Translator),$$etranslator.
001481536 7001_ $$aYin, Rui$$c(Translator),$$etranslator.
001481536 7102_ $$aProQuest (Firm)
001481536 77608 $$iPrint version:$$aYin, Yongfeng, 1978-$$tEmbedded software system testing$$dBoca Raton : CRC Press, 2024$$z9781032488189$$w(DLC)  2022059392
001481536 852__ $$bebk
001481536 85640 $$3GOBI DDA$$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=7272958$$zOnline Access
001481536 909CO $$ooai:library.usi.edu:1481536$$pGLOBAL_SET
001481536 980__ $$aBIB
001481536 980__ $$aEBOOK
001481536 982__ $$aEbook
001481536 983__ $$aOnline