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001485266 020__ $$z9781119477136
001485266 020__ $$a9781119477112 (e-book)
001485266 035__ $$a(MiAaPQ)EBC6198561
001485266 035__ $$a(Au-PeEL)EBL6198561
001485266 035__ $$a(OCoLC)1155321349
001485266 040__ $$aMiAaPQ$$beng$$erda$$epn$$cMiAaPQ$$dMiAaPQ
001485266 050_4 $$aTK7876$$b.D867 2020
001485266 0820_ $$a621.381330287$$223
001485266 1001_ $$aDunsmore, Joel P.,$$eauthor.
001485266 24510 $$aHandbook of microwave component measurements :$$bwith advanced VNA techniques /$$cJoel P. Dunsmore.
001485266 250__ $$aSecond edition.
001485266 264_1 $$aHoboken, New Jersey ;$$aChichester, West Sussex, England :$$bWiley,$$c[2020]
001485266 264_4 $$c2020
001485266 300__ $$a1 online resource (837 pages).
001485266 336__ $$atext$$btxt$$2rdacontent
001485266 337__ $$acomputer$$bc$$2rdamedia
001485266 338__ $$aonline resource$$bcr$$2rdacarrier
001485266 504__ $$aIncludes bibliographical references and index.
001485266 506__ $$aAccess limited to authorized users.
001485266 588__ $$aDescription based on print version record.
001485266 650_0 $$aMicrowave devices$$xTesting.
001485266 655_0 $$aElectronic books
001485266 77608 $$iPrint version:$$aDunsmore, Joel P.$$tHandbook of microwave component measurements : with advanced VNA techniques.$$bSecond edition.$$dHoboken, New Jersey ; Chichester, West Sussex, England : Wiley, c2020 $$z9781119477136
001485266 852__ $$bebk
001485266 85640 $$3ProQuest Ebook Central Academic Complete $$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=6198561$$zOnline Access
001485266 909CO $$ooai:library.usi.edu:1485266$$pGLOBAL_SET
001485266 980__ $$aBIB
001485266 980__ $$aEBOOK
001485266 982__ $$aEbook
001485266 983__ $$aOnline