000017627 000__ 00624cam\a2200217I\\4500
000017627 001__ 17627
000017627 005__ 20210513003704.0
000017627 008__ 750718s1966\\\\inua\\\\\\\\\\000\0\eng\d
000017627 010__ $$a66-025344
000017627 035__ $$a(OCoLC)ocm01458679
000017627 040__ $$aJPL$$cJPL$$dISE
000017627 049__ $$aISEA
000017627 0500_ $$aTK7872.P7$$bG68 1966
000017627 0820_ $$a621.381
000017627 1001_ $$aGraf, Rudolf F.
000017627 24510 $$aABC's of electronic test probes,$$cby Rudolf F. Graf.
000017627 250__ $$a[2d ed.]
000017627 260__ $$aIndianapolis,$$bH. W. Sams$$c[1966]
000017627 300__ $$a128 p.$$billus.$$c22 cm.
000017627 4900_ $$aA Howard W. Sams photofact publication, APG-1
000017627 650_0 $$aProbes (Electronic instruments )
000017627 85200 $$bgen$$hTK7872.P7$$iG68$$i1966
000017627 909CO $$ooai:library.usi.edu:17627$$pGLOBAL_SET
000017627 980__ $$aBIB
000017627 980__ $$aBOOK