Quantitative characterization of micro-topography : a bibliography of industrial surface metrology / by Richard J. Pike and Tom R. Thomas.
1998
I 19.76: 98-768
Available at Government Documents Microfiche
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Details
Title
Quantitative characterization of micro-topography : a bibliography of industrial surface metrology / by Richard J. Pike and Tom R. Thomas.
Author
Pike, Richard J.
Publication Details
Menlo Park, CA : U.S. Dept. of the Interior, U.S. Geological Survey, 1998.
Language
English
Description
145 p. : ill. ; 28 cm.
Call Number
I 19.76: 98-768
GPO Item No.
0624-H
Note
"Provides 4800 literature citations on the quantification of micro- and nano-topographic surfaces and a brief introduction to the field of industrial surface metrology"
Cover title.
Cover title.
Added Author
Thomas, Tom R.
Added Corporate Author
Geological Survey (U.S.)
Series
U.S. Geological Survey open-file report 98-768.
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