000228758 000__ 01764cam\a2200373Ka\45e0 000228758 001__ 228758 000228758 005__ 20220217104251.0 000228758 008__ 000222s1999\\\\vau\\\\\b\\\\f100\0\eng\d 000228758 035__ $$a(OCoLC)ocm43498227 000228758 035__ $$a228758 000228758 037__ $$a19990068469 thru 19990068479$$bNASA 000228758 040__ $$aGPO$$cGPO 000228758 049__ $$aISEA 000228758 074__ $$a0830-H-10 (MF) 000228758 0860_ $$aNAS 1.55:209140 000228758 1112_ $$aSecond Annual Symposium for Nondestructive Evaluation of Bond Strength$$d(1998 :$$cLangley Research Center) 000228758 24510 $$aProceedings of the Second Annual Symposium for Nondestructive Evaluation of Bond Strength$$h[microform] /$$ccompiled by Mark J. Roberts ; proceedings of a symposium sponsored by the National Aeronautics and Space Administration, Washington, D.C., and held at Langley Research Center, Hampton, Virginia, November 6, 1998. 000228758 24630 $$aSecond Annual Symposium for Nondestructive Evaluation of Bond Strength 000228758 260__ $$aHampton, Va. :$$bNational Aeronautics and Space Administration, Langley Research Center ;$$aSpringfield, Va. :$$bNational Technical Information Service [distributor,$$c1999] 000228758 300__ $$a1 v. 000228758 4901_ $$a[NASA conference publication] ;$$vNASA/CP-1999-209140 000228758 500__ $$aShipping list no.: 2000-0278-M. 000228758 533__ $$aMicrofiche.$$b[Washington, D.C. :$$cNational Aeronautics and Space Administration,$$d1999]$$e3 microfiches. 000228758 650_7 $$aUltrasonics.$$2nasat 000228758 650_7 $$aAdhesives.$$2nasat 000228758 650_7 $$aComputational chemistry.$$2nasat 000228758 650_7 $$aMicrowaves.$$2nasat 000228758 650_7 $$aMicrostructure.$$2nasat 000228758 650_7 $$aAcoustic velocity.$$2nasat 000228758 650_7 $$aStimulated emission.$$2nasat 000228758 7001_ $$aRoberts, Mark J. 000228758 7102_ $$aLangley Research Center. 000228758 830_0 $$aNASA conference publication ;$$v209140. 000228758 85230 $$bdfich$$hTD 1.55:$$i209140 000228758 909CO $$ooai:library.usi.edu:228758$$pGLOBAL_SET 000228758 980__ $$aBIB 000228758 980__ $$aGOV RESOURCE 000228758 994__ $$aE0$$bISE