Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry :: science and technology research report /: John M. Butler and Christopher H. Becker.

Butler, John M.; Becker, Christopher H.; National Institute of Justice (U.S.)

Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry : science and technology research report / John M. Butler and Christopher H. Becker.

Butler, John M. (John Marshall), 1969-; Becker, Christopher H.; National Institute of Justice (U.S.)

2001

QP624.5.D73 B88 2001 (Mapit)

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Title

Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry : science and technology research report / John M. Butler and Christopher H. Becker.

Author

Butler, John M. (John Marshall), 1969-

Published

Washington, DC : U.S. Department of Justice, Office of Justice Programs, National Institute of Justice, [2001]

Language

English

Description

ix, 75 pages : illustrations (some color) ; 23 cm

Call Number

QP624.5.D73 B88 2001

GPO Item No.

0718-A

Note

Shipping list no.: 2002-0046-P.
"October 2001."

Bibliography, etc. Note

Includes bibliographical references (p. 73-74).
"Grant number 97-LB-VX-0003"--T.p. verso.

Added Author

Becker, Christopher H.

Added Corporate Author

National Institute of Justice (U.S.)

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Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry : science and technology research report / John M. Butler and Christopher H. Becker.

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