000273488 000__ 00900cam\a22003014a\45e0
000273488 001__ 273488
000273488 005__ 20210513103149.0
000273488 008__ 030724s2004\\\\wiua\\\\\b\\\\001\0\eng\\
000273488 010__ $$a  2003016816
000273488 020__ $$a0873896068 (alk. paper)
000273488 035__ $$a(OCoLC)ocm52773519
000273488 035__ $$a273488
000273488 040__ $$aDLC$$cDLC
000273488 042__ $$apcc
000273488 049__ $$aISEA
000273488 05000 $$aTS156.2$$b.P46 2004
000273488 08200 $$a658.5/68$$222
000273488 1001_ $$aPennella, C. Robert.
000273488 24510 $$aManaging the metrology system /$$cC. Robert Pennella.
000273488 250__ $$a3rd ed.
000273488 260__ $$aMilwaukee, Wis. :$$bASQ Quality Press,$$cc2004.
000273488 300__ $$axii, 212 p. :$$bill. ;$$c24 cm.
000273488 504__ $$aIncludes bibliographical references and index.
000273488 650_0 $$aEngineering inspection.
000273488 650_0 $$aMeasurement.
000273488 650_0 $$aQuality control.
000273488 85200 $$bgen$$hTS156.2$$i.P46$$i2004
000273488 85641 $$3Table of contents$$uhttp://www.loc.gov/catdir/toc/ecip047/2003016816.html
000273488 909CO $$ooai:library.usi.edu:273488$$pGLOBAL_SET
000273488 980__ $$aBIB
000273488 980__ $$aBOOK
000273488 994__ $$aE0$$bISE