TY  - BOOK
T1  - World class reliability :using Multiple Environment Overstress Tests to make it happen /
DA  - c2004.
CY  - New York :
AU  - Bhote, Keki R.,
AU  - Bhote, Adi K.
CN  - TA169
CN  - TA169
PB  - American Management Association,
PP  - New York :
PY  - c2004.
ID  - 277461
KW  - Reliability (Engineering)
SN  - 0814407927
TI  - World class reliability :using Multiple Environment Overstress Tests to make it happen /
LK  - http://www.loc.gov/catdir/toc/ecip048/2003019970.html
UR  - http://www.loc.gov/catdir/toc/ecip048/2003019970.html
ER  -