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000277461 010__ $$a  2003019970
000277461 020__ $$a0814407927
000277461 035__ $$a(OCoLC)ocm53059621
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000277461 049__ $$aISEA
000277461 05000 $$aTA169$$b.B48 2004
000277461 08200 $$a620/.00452$$222
000277461 1001_ $$aBhote, Keki R.,$$d1925-2013.
000277461 24510 $$aWorld class reliability :$$busing Multiple Environment Overstress Tests to make it happen /$$cKeki R. Bhote and Adi K. Bhote.
000277461 260__ $$aNew York :$$bAmerican Management Association,$$cc2004.
000277461 300__ $$axix, 218 p. :$$bill. ;$$c24 cm.
000277461 504__ $$aIncludes bibliographical references (p. 209-210) and index.
000277461 650_0 $$aReliability (Engineering)
000277461 7001_ $$aBhote, Adi K.
000277461 85200 $$bgen$$hTA169$$i.B48$$i2004
000277461 85641 $$3Table of contents$$uhttp://www.loc.gov/catdir/toc/ecip048/2003019970.html
000277461 909CO $$ooai:library.usi.edu:277461$$pGLOBAL_SET
000277461 938__ $$aIngram$$bINGR$$n0814407927
000277461 980__ $$aBIB
000277461 980__ $$aBOOK
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