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World class reliability : using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote.

Bhote, Keki R., 1925-2013.; Bhote, Adi K.
2004
TA169 .B48 2004 (Mapit)
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Title
World class reliability : using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote.
Author
Bhote, Keki R., 1925-2013.
ISBN
0814407927
Published
New York : American Management Association, [2004]
Copyright
©2004
Language
English
Description
xix, 218 pages : illustrations ; 24 cm
Call Number
TA169 .B48 2004
Dewey Decimal Classification
620/.00452
Bibliography, etc. Note
Includes bibliographical references (p. 209-210) and index.
Added Author
Bhote, Adi K.
Linked Resources
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On-Campus Resources > Books
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