000277986 000__ 00754cam\a2200253\a\45e0 000277986 001__ 277986 000277986 005__ 20210513103924.0 000277986 008__ 030609s2003\\\\enka\\\\\b\\\\001\0\eng\\ 000277986 015__ $$aGBA2-Z5021 000277986 020__ $$a0521773563 000277986 035__ $$a(OCoLC)ocm48784338 000277986 035__ $$a277986 000277986 040__ $$aUKM$$cUKM$$dTEF 000277986 049__ $$aISEA 000277986 08204 $$a621.381548$$221 000277986 090__ $$aTK7874.65$$b.J53 2003 000277986 1001_ $$aJha, Niraj K. 000277986 24510 $$aTesting of digital systems /$$cN.K. Jha and S. Gupta. 000277986 260__ $$aCambridge :$$bCambridge University Press,$$c2003. 000277986 300__ $$axvi, 1000 p. :$$bill. ;$$c26 cm. 000277986 504__ $$aIncludes bibliographical references and index. 000277986 650_0 $$aDigital integrated circuits$$xTesting. 000277986 7001_ $$aGupta, S.$$q(Sandeep),$$d1962- 000277986 85200 $$bgen$$hTK7874.65$$i.J53$$i2003 000277986 909CO $$ooai:library.usi.edu:277986$$pGLOBAL_SET 000277986 980__ $$aBIB 000277986 980__ $$aBOOK 000277986 994__ $$aE0$$bISE