@article{364288,
      recid = {364288},
      author = {Bahukudumbi, Sudarshan. and Chakrabarty, Krishnendu.},
      title = {Wafer-level testing and test during burn-in for integrated  circuits [electronic resource] /},
      publisher = {Artech House,},
      address = {Boston :},
      pages = {xv, 198 p. :},
      year = {2010},
      url = {http://library.usi.edu/record/364288},
}