Wafer-level testing and test during burn-in for integrated circuits: [electronic resource] /: Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

2010

TK7874 .B35 2010eb

Formats

Linked Resource

Title

Wafer-level testing and test during burn-in for integrated circuits [electronic resource] / Sudarshan Bahukudumbi, Krishnendu Chakrabarty.

Author

ISBN

9781596939899
1596939893

Publication Details

Boston : Artech House, 2010.

Language

English

Description

xv, 198 p. : ill.

Call Number

TK7874 .B35 2010eb

Dewey Decimal Classification

621.38132

Bibliography, etc. Note

Includes bibliographical references and index.

Access Note

Access limited to authorized users.

Added Author

Series

Artech House integrated microsystems series.

Linked Resources

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