TY  - GEN
T1  - Terrestrial neutron-induced soft errors in advanced memory devices
DA  - c2008.
CY  - Hackensack, NJ :
AU  - Nakamura, Takashi,
CN  - Ebrary Academic Complete
CN  - TK7895.M4
PB  - World Scientific,
PP  - Hackensack, NJ :
PY  - c2008.
ID  - 378009
KW  - Semiconductor storage devices.
KW  - Neutron irradiation.
KW  - Radiation dosimetry.
KW  - Nuclear physics.
TI  - Terrestrial neutron-induced soft errors in advanced memory devices
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10255560
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10255560
ER  -