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000378009 020__ $$z9789812778819
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000378009 035__ $$a(OCoLC)646768382
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000378009 05014 $$aTK7895.M4$$bT47 2008eb
000378009 24500 $$aTerrestrial neutron-induced soft errors in advanced memory devices$$h[electronic resource] /$$cTakashi Nakamura ... [et al.].
000378009 260__ $$aHackensack, NJ :$$bWorld Scientific,$$cc2008.
000378009 300__ $$axxii, 343 p. :$$bill. (some col.)
000378009 504__ $$aIncludes bibliographical references (p. 291-315) and index.
000378009 506__ $$aAccess limited to authorized users.
000378009 650_0 $$aSemiconductor storage devices.
000378009 650_0 $$aNeutron irradiation.
000378009 650_0 $$aRadiation dosimetry.
000378009 650_0 $$aNuclear physics.
000378009 655_7 $$aElectronic books.$$2lcsh
000378009 7001_ $$aNakamura, Takashi,$$d1939-
000378009 85280 $$bebk$$hEbrary Academic Complete
000378009 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10255560$$zOnline Access
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000378009 980__ $$aEBOOK
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000378009 982__ $$aEbook
000378009 983__ $$aOnline