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000383663 010__ $$z  2009001775
000383663 020__ $$z9789812839510 (hardcover : alk. paper)
000383663 020__ $$z9812839518 (hardcover : alk. paper)
000383663 035__ $$a(CaPaEBR)ebr10361861
000383663 035__ $$a(OCoLC)647851920
000383663 040__ $$aCaPaEBR$$cCaPaEBR
000383663 05014 $$aQA465$$b.A58 2008eb
000383663 08204 $$a530.8$$222
000383663 1112_ $$aAMCTM VIII$$d(2008 :$$cParis, France)
000383663 24510 $$aAdvanced mathematical & computational tools in metrology & testing VIII$$h[electronic resource] /$$ceditors, F. Pavese ... [et al.].
000383663 2463_ $$aAdvanced mathematical and computational tools in metrology and testing VIII
000383663 2463_ $$aAMCTM 8
000383663 260__ $$aSingapore ;$$aHackensack, NJ :$$bWorld Scientific,$$cc2009.
000383663 300__ $$axii, 406 p. :$$bill. ;$$c24 cm.
000383663 4901_ $$aSeries on advances in mathematics for applied sciences ;$$vv. 78
000383663 504__ $$aIncludes bibliographical references and index.
000383663 506__ $$aAccess limited to authorized users.
000383663 650_0 $$aMeasurement$$vCongresses.
000383663 650_0 $$aPhysical measurements$$vCongresses.
000383663 650_0 $$aMetrology$$vCongresses.
000383663 655_7 $$aElectronic books.$$2lcsh
000383663 7001_ $$aPavese, Franco.
000383663 830_0 $$aSeries on advances in mathematics for applied sciences ;$$vv. 78.
000383663 85280 $$bebk$$hProquest Ebook Central Academic Complete
000383663 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10361861$$zOnline Access
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000383663 980__ $$aEBOOK
000383663 980__ $$aBIB
000383663 982__ $$aEbook
000383663 983__ $$aOnline