TY  - GEN
AU  - Haimes, Yacov Y.
CN  - T174.5
CY  - Hoboken, N.J. :
DA  - c2004.
ET  - 2nd ed.
ID  - 383981
KW  - Technology
KW  - Technology
KW  - Risk management.
KW  - Risk management
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=224935
N1  - "Wiley-Interscience publication."
PB  - John Wiley & Sons,
PP  - Hoboken, N.J. :
PY  - c2004.
T1  - Risk modeling, assessment, and management/
TI  - Risk modeling, assessment, and management/
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=224935
ER  -