TY  - GEN
T1  - Thin film materialsstress, defect formation, and surface evolution /
DA  - 2003.
CY  - Cambridge, UK ;
CY  - New York :
AU  - Freund, L. B.
AU  - Suresh, S.
CN  - Proquest Ebook Central Academic Complete
CN  - TA418.9.T45
PB  - Cambridge University Press,
PP  - Cambridge, UK ;
PP  - New York :
PY  - 2003.
ID  - 388809
KW  - Thin films.
KW  - Surfaces (Technology)
TI  - Thin film materialsstress, defect formation, and surface evolution /
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10120453
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10120453
ER  -