Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
2002
TK7871.99.M44 O95 2002eb
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Details
Title
Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
ISBN
9810248423
Publication Details
[River Edge, NJ] : World Scientific, c2002.
Language
English
Description
ix, 270 p. : ill. ; 26 cm.
Call Number
TK7871.99.M44 O95 2002eb
Dewey Decimal Classification
621.39/732
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Added Author
Series
Selected topics in electronics and systems ; v. 23.
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