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000396519 010__ $$z   99018754 
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000396519 035__ $$a(OCoLC)646722251
000396519 040__ $$aCaPaEBR$$cCaPaEBR
000396519 05014 $$aQC611.98.H54$$bC43 2000eb
000396519 08204 $$a537.6/23/0284$$221
000396519 24500 $$aCharacterization of high Tc materials and devices by electron microscopy$$h[electronic resource] /$$cedited by Nigel D. Browning, Stephen J. Pennycook.
000396519 260__ $$aCambridge ;$$aNew York :$$bCambridge University Press,$$c2000.
000396519 300__ $$axii, 391 p. :$$bill. ;$$c26 cm.
000396519 504__ $$aIncludes bibliographical references.
000396519 506__ $$aAccess limited to authorized users.
000396519 650_0 $$aHigh temperature superconductors.
000396519 650_0 $$aElectron microscopy$$xTechnique.
000396519 655_7 $$aElectronic books.$$2lcsh
000396519 7001_ $$aBrowning, Nigel D.
000396519 7001_ $$aPennycook, Stephen J.
000396519 85280 $$bebk$$hProquest Ebook Central Academic Complete
000396519 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10065742$$zOnline Access
000396519 909CO $$ooai:library.usi.edu:396519$$pGLOBAL_SET
000396519 980__ $$aEBOOK
000396519 980__ $$aBIB
000396519 982__ $$aEbook
000396519 983__ $$aOnline