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000400275 020__ $$z9781607500230
000400275 035__ $$a(CaPaEBR)ebr10331638
000400275 035__ $$a(OCoLC)646833301
000400275 040__ $$aCaPaEBR$$cCaPaEBR
000400275 05014 $$aTA417.3$$b.E484 2009eb
000400275 1112_ $$aInternational Workshop on Electromagnetic Nondestructive Evaluation$$n(13th :$$d2008 :$$cSeoul, Korea)
000400275 24510 $$aElectromagnetic nondestructive evaluation (XII)$$h[electronic resource] /$$cedited by Young-Kil Shin, Hyang-Beom Lee and Sung-Jin Song.
000400275 260__ $$aAmsterdam :$$bIOS,$$c2009.
000400275 300__ $$axxvii, 416 p. :$$bill.
000400275 4901_ $$aStudies in applied electromagnetics and mechanics,$$x1383-7281 ;$$vv. 32
000400275 504__ $$aIncludes bibliographical references and index.
000400275 506__ $$aAccess limited to authorized users.
000400275 650_0 $$aElectromagnetic measurements$$vCongresses.
000400275 650_0 $$aNondestructive testing$$vCongresses.
000400275 655_7 $$aElectronic books.$$2lcsh
000400275 7001_ $$aShin, Young-Kil.
000400275 7001_ $$aLee, Hyang-Beom.
000400275 7001_ $$aSong, Sung-Jin.
000400275 830_0 $$aStudies in applied electromagnetics and mechanics ;$$vv. 32.
000400275 852__ $$bebk
000400275 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10331638$$zOnline Access
000400275 909CO $$ooai:library.usi.edu:400275$$pGLOBAL_SET
000400275 980__ $$aEBOOK
000400275 980__ $$aBIB
000400275 982__ $$aEbook
000400275 983__ $$aOnline