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000405762 020__ $$z158053709X
000405762 020__ $$z9781580537094
000405762 020__ $$z9781580537100
000405762 035__ $$a(CaPaEBR)ebr10221935
000405762 035__ $$a(OCoLC)648366990
000405762 040__ $$aCaPaEBR$$cCaPaEBR
000405762 05014 $$aTK7895.E42$$bK49 2007eb
000405762 1001_ $$aKelly, Joe,$$d1971-
000405762 24510 $$aAdvanced production testing of RF, SoC, and SiP devices$$h[electronic resource] /$$cJoe Kelly, Michael Engelhardt.
000405762 260__ $$aBoston :$$bArtech House,$$c2007.
000405762 300__ $$axx, 301 p. :$$bill.
000405762 4901_ $$aArtech House microwave library
000405762 504__ $$aIncludes bibliographical references and index.
000405762 506__ $$aAccess limited to authorized users.
000405762 650_0 $$aSystems on a chip$$xTesting.
000405762 650_0 $$aEmbedded computer systems.
000405762 655_7 $$aElectronic books.$$2lcsh
000405762 7001_ $$aEngelhardt, M.$$q(Michael)
000405762 830_0 $$aArtech House microwave library.
000405762 852__ $$bebk
000405762 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10221935$$zOnline Access
000405762 909CO $$ooai:library.usi.edu:405762$$pGLOBAL_SET
000405762 980__ $$aEBOOK
000405762 980__ $$aBIB
000405762 982__ $$aEbook
000405762 983__ $$aOnline