TY  - GEN
T1  - ESD :failure mechanisms and models /
DA  - 2009.
CY  - Chichester, West Sussex, U.K. ;
CY  - Hoboken, NJ :
AU  - Voldman, Steven H.
CN  - TK7871.852
PB  - J. Wiley,
PP  - Chichester, West Sussex, U.K. ;
PP  - Hoboken, NJ :
PY  - 2009.
ID  - 408294
KW  - Semiconductors
KW  - Integrated circuits
KW  - Integrated circuits
KW  - Integrated circuits
KW  - Electric discharges.
KW  - Electrostatics.
TI  - ESD :failure mechanisms and models /
LK  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=454456
UR  - https://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=454456
ER  -