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000408294 010__ $$z  2009015206
000408294 020__ $$z9780470511374 (cloth)
000408294 035__ $$a(MiAaPQ)EBC454456
000408294 035__ $$a(Au-PeEL)EBL454456
000408294 035__ $$a(CaPaEBR)ebr10317806
000408294 035__ $$a(CaONFJC)MIL223713
000408294 035__ $$a(OCoLC)609844472
000408294 040__ $$aMiAaPQ$$cMiAaPQ$$dMiAaPQ
000408294 050_4 $$aTK7871.852$$b.V65 2009
000408294 08204 $$a621.381$$222
000408294 1001_ $$aVoldman, Steven H.
000408294 24510 $$aESD :$$bfailure mechanisms and models /$$cSteven H. Voldman.
000408294 2463_ $$aElectrostatic discharge
000408294 260__ $$aChichester, West Sussex, U.K. ;$$aHoboken, NJ :$$bJ. Wiley,$$c2009.
000408294 300__ $$a1 online resource (xxiv, 384 pages).
000408294 336__ $$atext$$2rdacontent
000408294 337__ $$acomputer$$2rdamedia
000408294 338__ $$aonline resource$$2rdacarrier
000408294 504__ $$aIncludes bibliographical references and index.
000408294 506__ $$aAccess limited to authorized users.
000408294 650_0 $$aSemiconductors$$xFailures.
000408294 650_0 $$aIntegrated circuits$$xProtection.
000408294 650_0 $$aIntegrated circuits$$xTesting.
000408294 650_0 $$aIntegrated circuits$$xReliability.
000408294 650_0 $$aElectric discharges.
000408294 650_0 $$aElectrostatics.
000408294 655_0 $$aElectronic books
000408294 852__ $$bebk
000408294 85640 $$3ProQuest Ebook Central Academic Complete $$uhttps://univsouthin.idm.oclc.org/login?url=https://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=454456$$zOnline Access
000408294 909CO $$ooai:library.usi.edu:408294$$pGLOBAL_SET
000408294 980__ $$aBIB
000408294 980__ $$aEBOOK
000408294 982__ $$aEbook
000408294 983__ $$aOnline