TY  - GEN
T1  - Fakebusters IIscientific detection of fakery in art and philately /
DA  - c2004.
CY  - Singapore ;
CY  - Hackensack, N.J. :
AU  - Weiss, Richard J.
AU  - Chartier, Duane R.
VL  - v. 4
CN  - N8790
PB  - World Scientific,
PP  - Singapore ;
PP  - Hackensack, N.J. :
PY  - c2004.
N1  - "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
ID  - 412172
KW  - Art
KW  - Art
KW  - Art
KW  - Expertising, X-ray
KW  - Science and the arts
KW  - Art and science
TI  - Fakebusters IIscientific detection of fakery in art and philately /
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10174034
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10174034
ER  -