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000412223 020__ $$z9812563954
000412223 035__ $$a(CaPaEBR)ebr10174085
000412223 035__ $$a(OCoLC)648234363
000412223 040__ $$aCaPaEBR$$cCaPaEBR
000412223 05014 $$aTK7871.85$$b.L48 2005eb
000412223 1001_ $$aLevinshteĭn, M. E.$$q(Mikhail Efimovich)
000412223 24510 $$aBreakdown phenomena in semiconductors and semiconductor devices$$h[electronic resource] /$$cMichael Levinshtein, Juha Kostamovaara, Sergey Vainshtein.
000412223 260__ $$aNew Jersey ;$$aLondon :$$bWorld Scientific,$$cc2005.
000412223 300__ $$axiii, 208 p. :$$bill.
000412223 4901_ $$aSelected topics in electronics and systems ;$$vv. 36
000412223 504__ $$aIncludes bibliographical references and indexes.
000412223 506__ $$aAccess limited to authorized users.
000412223 650_0 $$aSemiconductors.
000412223 650_0 $$aBreakdown (Electricity)
000412223 650_0 $$aHigh voltages.
000412223 655_7 $$aElectronic books.$$2lcsh
000412223 7001_ $$aKostamovaara, Juha.
000412223 7001_ $$aVainshtein, Sergey.
000412223 830_0 $$aSelected topics in electronics and systems ;$$vv. 36.
000412223 852__ $$bebk
000412223 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10174085$$zOnline Access
000412223 909CO $$ooai:library.usi.edu:412223$$pGLOBAL_SET
000412223 980__ $$aEBOOK
000412223 980__ $$aBIB
000412223 982__ $$aEbook
000412223 983__ $$aOnline