TY - GEN AU - Czanderna, Alvin Warren, AU - Madey, Theodore E. AU - Powell, C. J. CN - TA418.7 CY - New York : DA - c1998. ID - 420861 KW - Surfaces (Technology) KW - Materials LK - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10046976 PB - Plenum Press, PP - New York : PY - c1998. T1 - Beam effects, surface topography, and depth profiling in surface analysis TI - Beam effects, surface topography, and depth profiling in surface analysis UR - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10046976 VL - v. 5 ER -