TY  - GEN
AU  - Czanderna, Alvin Warren,
AU  - Madey, Theodore E.
AU  - Powell, C. J.
CN  - TA418.7
CY  - New York :
DA  - c1998.
ID  - 420861
KW  - Surfaces (Technology)
KW  - Materials
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10046976
PB  - Plenum Press,
PP  - New York :
PY  - c1998.
T1  - Beam effects, surface topography, and depth profiling in surface analysis
TI  - Beam effects, surface topography, and depth profiling in surface analysis
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10046976
VL  - v. 5
ER  -