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000420861 010__ $$z   98041250 
000420861 020__ $$z0306458969
000420861 035__ $$a(CaPaEBR)ebr10046976
000420861 035__ $$a(OCoLC)647285399
000420861 040__ $$aCaPaEBR$$cCaPaEBR
000420861 05014 $$aTA418.7$$b.B43 1998eb
000420861 08204 $$a620/.44$$221
000420861 24500 $$aBeam effects, surface topography, and depth profiling in surface analysis$$h[electronic resource] /$$cedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
000420861 260__ $$aNew York :$$bPlenum Press,$$cc1998.
000420861 300__ $$axix, 430 p. :$$bill. ;$$c24 cm.
000420861 4901_ $$aMethods of surface characterization ;$$vv. 5
000420861 504__ $$aIncludes bibliographical references and index.
000420861 506__ $$aAccess limited to authorized users.
000420861 650_0 $$aSurfaces (Technology)$$xAnalysis.
000420861 650_0 $$aMaterials$$xEffect of radiation on.
000420861 655_7 $$aElectronic books.$$2lcsh
000420861 7001_ $$aCzanderna, Alvin Warren,$$d1930-
000420861 7001_ $$aMadey, Theodore E.
000420861 7001_ $$aPowell, C. J.$$q(Cedric John)
000420861 830_0 $$aMethods of surface characterization ;$$vv. 5.
000420861 852__ $$bebk
000420861 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10046976$$zOnline Access
000420861 909CO $$ooai:library.usi.edu:420861$$pGLOBAL_SET
000420861 980__ $$aEBOOK
000420861 980__ $$aBIB
000420861 982__ $$aEbook
000420861 983__ $$aOnline