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000430358 020__ $$a9789814324779$$q(electronic book)
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000430358 035__ $$a(MiAaPQ)EBC731150
000430358 035__ $$a(CaPaEBR)ebr10479780
000430358 035__ $$a(OCoLC)738438959
000430358 040__ $$aCaPaEBR$$cCaPaEBR
000430358 05014 $$aQH212.S33$$bS33 2011eb
000430358 24500 $$aScanning probe microscopy$$h[electronic resource] /$$ceditors, Nikodem Tomczak, Kuan Eng Johnson Goh.
000430358 260__ $$aSingapore ;$$aHackensack, N.J. :$$bWorld Scientific Pub. Co.,$$c2011.
000430358 300__ $$a1 online resource (xiv, 261 p.) :$$bill.
000430358 504__ $$aIncludes bibliographical references and index.
000430358 506__ $$aAccess limited to authorized users.
000430358 650_0 $$aScanning probe microscopy.
000430358 650_0 $$aNanoelectronics.
000430358 7001_ $$aTomczak, Nikodem.
000430358 7001_ $$aGoh, Kuan Eng Johnson.
000430358 85280 $$bebk$$hProQuest Ebook Central Academic Complete
000430358 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://ebookcentral.proquest.com/lib/usiricelib-ebooks/detail.action?docID=731150$$zOnline Access
000430358 909CO $$ooai:library.usi.edu:430358$$pGLOBAL_SET
000430358 980__ $$aEBOOK
000430358 980__ $$aBIB
000430358 982__ $$aEbook
000430358 983__ $$aOnline