Aberration-corrected analytical transmission electron microscopy [electronic resource] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks.
2011
QH212.T7 A24 2011eb
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Title
Aberration-corrected analytical transmission electron microscopy [electronic resource] / edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks.
ISBN
9780470518519 (hardback)
9781119978848
9781119979906
9781119979913
9781119978855 (e-book)
9781119978848
9781119979906
9781119979913
9781119978855 (e-book)
Publication Details
Hoboken, N.J. : Wiley, 2011.
Language
English
Description
xv, 280 p., [8] leaves of plates : ill. (some col.)
Call Number
QH212.T7 A24 2011eb
Summary
"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- Provided by publisher.
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Provided by publisher.
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Provided by publisher.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Added Author
Brydson, Rik.
Brooks, Susan.
Brooks, Susan.
Added Corporate Author
Royal Microscopical Society (Great Britain)
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