TY  - GEN
T1  - ISTFA 2011conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
DA  - 2011.
CY  - Materials Park, Ohio :
CN  - Proquest Ebook Central Academic Complete
CN  - TK7871
PB  - ASM International,
PP  - Materials Park, Ohio :
PY  - 2011.
ID  - 445364
KW  - Electronics
KW  - Electronic apparatus and appliances
TI  - ISTFA 2011conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10540844
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10540844
ER  -