Testing complex and embedded systems [electronic resource] / Kim H. Pries, Jon M. Quigley.
Pries, Kim H., 1955-; Quigley, Jon M.
2011
TK7895.E42 P738 2011eb
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Title Testing complex and embedded systems [electronic resource] / Kim H. Pries, Jon M. Quigley.
Author Pries, Kim H., 1955-
ISBN 9781439821411 (electronic bk.)
1439821410 (electronic bk.)
9781439821404
1439821402
Imprint Boca Raton, FL : CRC Press, c2011.
Language English
Description 1 online resource (xxxi, 287 p.) : ill.
Call Number TK7895.E42 P738 2011eb
Dewey Decimal Classification 004.16
Summary "Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"--Provided by publisher.
Note "An Auerbach Book."
Bibliography, etc. Note Includes bibliographical references and index.
Access Note Access limited to authorized users.
System Details Note Mode of access: World Wide Web.
Source of Description Description based on print version record.
Added Author Quigley, Jon M.
Available in Other Form Testing complex and embedded systems.
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1. Does your testing look like this?
2. Benefits of improved testing
3. Overview
4. Basic principles
5. The question
6. Contradictory perspectives of testing
7. The use of noise
8. How to perform 'bad' tests
9. Documenting the testing
10. Test administration
11. Advanced concepts
12. Software test documentation
13. Configuration management
14. Software testing
15. Systems testing
16. Simulation and emulation
17. Span of tests
18. Exit criteria.

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