VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
2006
TK7874.75 .V587 2006eb
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Title
VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
ISBN
0123705975 (hardcover : alk. paper)
9780123705976
9780123705976
Publication Details
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Language
English
Description
xxx, 777 p. : ill. ; 25 cm.
Call Number
TK7874.75 .V587 2006eb
Dewey Decimal Classification
621.39/5
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Series
Morgan Kaufmann series in systems on silicon.
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