@article{447628,
      author = {Wang, Laung-Terng. and Stroud, Charles E. and Touba, Nur  A.},
      url = {http://library.usi.edu/record/447628},
      title = {System-on-chip test architectures nanometer design for  testability / [electronic resource] :},
      publisher = {Morgan Kaufmann Publishers,},
      recid = {447628},
      pages = {xxxvi, 856 p. :},
      address = {Amsterdam ;},
      year = {2008},
}