TY  - GEN
T1  - System-on-chip test architecturesnanometer design for testability /
DA  - c2008.
CY  - Amsterdam ;
CY  - Boston :
AU  - Wang, Laung-Terng.
AU  - Stroud, Charles E.
AU  - Touba, Nur A.
CN  - TK7895.E42
PB  - Morgan Kaufmann Publishers,
PP  - Amsterdam ;
PP  - Boston :
PY  - c2008.
ID  - 447628
KW  - Systems on a chip
KW  - Integrated circuits
KW  - Integrated circuits
TI  - System-on-chip test architecturesnanometer design for testability /
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10203465
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10203465
ER  -