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000447628 010__ $$z  2007023373
000447628 020__ $$z9780123739735 (hardcover : alk. paper)
000447628 020__ $$z012373973X (hardcover : alk. paper)
000447628 035__ $$a(CaPaEBR)ebr10203465
000447628 035__ $$a(OCoLC)647688301
000447628 040__ $$aCaPaEBR$$cCaPaEBR
000447628 05014 $$aTK7895.E42$$bS978 2008eb
000447628 08204 $$a621.39/5$$222
000447628 24500 $$aSystem-on-chip test architectures$$h[electronic resource] :$$bnanometer design for testability /$$cedited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
000447628 260__ $$aAmsterdam ;$$aBoston :$$bMorgan Kaufmann Publishers,$$cc2008.
000447628 300__ $$axxxvi, 856 p. :$$bill. ;$$c25 cm.
000447628 4901_ $$aThe Morgan Kaufmann series in systems on silicon
000447628 504__ $$aIncludes bibliographical references and index.
000447628 506__ $$aAccess limited to authorized users.
000447628 650_0 $$aSystems on a chip$$xTesting.
000447628 650_0 $$aIntegrated circuits$$xVery large scale integration$$xTesting.
000447628 650_0 $$aIntegrated circuits$$xVery large scale integration$$xDesign.
000447628 655_7 $$aElectronic books.$$2lcsh
000447628 7001_ $$aWang, Laung-Terng.
000447628 7001_ $$aStroud, Charles E.
000447628 7001_ $$aTouba, Nur A.
000447628 830_0 $$aMorgan Kaufmann series in systems on silicon.
000447628 852__ $$bebk
000447628 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10203465$$zOnline Access
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000447628 980__ $$aEBOOK
000447628 980__ $$aBIB
000447628 982__ $$aEbook
000447628 983__ $$aOnline