High Mobility Ge-Based CMOS Device Technologies
SiGe-Mixing-Triggered Rapid-Melting-Growth of High-Mobility Ge-On-Insulator
Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Devices
Functional Device Applications of Nanosilicon
Tunable Single-Electron Turnstile Using Discrete Dopants in Nanoscale SOI-FETs
KFM Observation of Electron Charging and Discharging in Phosphorus-Doped SOI Channel
Photoluminescence Characteristics of Ultra-Thin Silicon-on-Insulator at Low Temperatures
Investigation about I-V Characteristics in a New Electronic Structure Model of the Ohmic Contact for Future Nano-Scale Ohmic Contact
Collective Electron Tunneling Model in Si-Nano Dot Floating Gate MOS Structure
Electronic Structure and Spin-Injection of Co-Based Heusler Alloy/ Semiconductor Junctions
First-Principles Calculations of the Dielectric Constant for the GeO2 Films
Nanosize Electronics Material Analysis by Local Quantities Based on the Rigged QED Theory
Novel Source Heterojunction Structures with Relaxed-/Strained-Layers for Quasi-Ballistic CMOS Transistors
Effect of Al2O3 Deposition and Subsequent Annealing on Passivation of Defects in Ge-Rich SiGe-on-Insulator
Controlled Synthesis of Carbon Nanowalls for Carbon Channel Engineering
Resistive Memory Utilizing Ferritin Protein with Nano Particle
Atomically Controlled Plasma Processing for Group IV Quantum Heterostructure Formation
Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction
Generation and Growth of Atomic-Scale Roughness at Surface and Interface of Silicon Dioxide Thermally Grown on Atomically Flat Si Surface
Nano-Surface Modification of Silicon with Ultra-Short Pulse Laser Process
Evaluation of Strained Silicon by Electron Back Scattering Pattern Compared with Raman Measurement and Edge Force Model Calculation
Development of New Methods for Fine-Wiring in Si Using a Wet Catalytic Reaction
Optical Response of Si-Quantum-Dots/NiSi-Nanodots Stack Hybrid Floating Gate in MOS Structures
Energy Band Engineering of Metal Nanodots for High Performance Nonvolatile Memory Application
Strained Ge and Ge1-xSnx Technology for Future CMOS Devices
Improved Electrical Properties and Thermal Stability of GeON Gate Dielectrics Formed by Plasma Nitridation of Ultrathin Oxides on Ge(100)
Structural Change during the Formation of Directly Bonded Silicon Substrates
Microscopic Structure of Directly Bonded Silicon Substrates
Formation of Nanotubes of Carbon by Joule Heating of Carbon-Contaminated Si Nanochains
Si Nanodot Device Fabricated by Thermal Oxidation and their Applications
Influences of Carrier Transport on Drain-Current Variability of MOSFETs
Resistive Switching in NiO Bilayer Films with Different Crystallinity Layers
Analysis of Threshold Voltage Variations in Fin Field Effect Transistors
Capture/Emission Processes of Carriers in Heterointerface Traps Observed in the Transient Charge-Pumping Characteristics of SiGe/Si-Hetero-Channel pMOSFETs
Quasi-Ballistic Transport in Nano-Scale Devices: Boundary Layer, Potential Fluctuation, and Coulomb Interaction
Effect of Back Bias on Variability in Intrinsic Channel SOI MOSFETs
Discrete Dopant Effects on Threshold Voltage Variation in Double-Gate and Gate-All-Around Metal-Oxide-Semiconductor Field-Effect-Transistors
Interconnect Design Challenges in Nano CMOS Circuit.