000462610 000__ 02952cam\a2200337\a\4500
000462610 001__ 462610
000462610 005__ 20210513162037.0
000462610 006__ m\\\\\\\\d\\\\\\\\
000462610 007__ cr\cn|||||||||
000462610 008__ 120430s2012\\\\enka\\\\sb\\\\001\0\eng\d
000462610 010__ $$z  2012011804
000462610 020__ $$z9780470664766 (cloth)
000462610 020__ $$z9781119979555
000462610 020__ $$z9781118391327 (e-book)
000462610 035__ $$a(CaPaEBR)ebr10593194
000462610 035__ $$a(OCoLC)792941574
000462610 040__ $$aCaPaEBR$$cCaPaEBR
000462610 05014 $$aTK7876$$b.D84 2012eb
000462610 08204 $$a537.5/344$$223
000462610 1001_ $$aDunsmore, Joel P.
000462610 24510 $$aHandbook of microwave component measurements$$h[electronic resource] :$$bwith advanced VNA techniques /$$cJoel P. Dunsmore.
000462610 260__ $$aChichester, West Sussex, U.K. :$$bJohn Wiley & Sons Inc.,$$c2012.
000462610 300__ $$axxiii, 611 p. :$$bill.
000462610 504__ $$aIncludes bibliographical references and index.
000462610 506__ $$aAccess limited to authorized users.
000462610 520__ $$a"A practical guide to the most modern techniques for microwave measurements Handbook of Microwave Component Measurements is a complete reference to this topic, focusing on the modern measurement tools, such as a Vector Network Analyzer (VNA), gathering in one place all the concepts, formulas, and best practices of measurement science. It includes basic concepts in each chapter as well as appendices which provide all the detail needed to understand the science behind microwave measurements. The book offers an insight into the best practices for ascertaining the true nature of the device-under-test (DUT), optimizing the time to setup and measure, and to the greatest extent possible, remove the effects of the measuring equipment from that result. Furthermore, the author presents information in a way that is easily accessible to the student or new engineer, but complete enough to provide details of measurement science for even the most advanced applications and researchers. Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described Includes an accompanying website containing example test scripts for setting up and processing device measurement and data "--$$cProvided by publisher.
000462610 650_0 $$aMicrowave devices$$xTesting.
000462610 655_7 $$aElectronic books.$$2lcsh
000462610 852__ $$bebk
000462610 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10593194$$zOnline Access
000462610 909CO $$ooai:library.usi.edu:462610$$pGLOBAL_SET
000462610 980__ $$aEBOOK
000462610 980__ $$aBIB
000462610 982__ $$aEbook
000462610 983__ $$aOnline