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000464842 020__ $$z9781608053599
000464842 035__ $$a(CaPaEBR)ebr10570978
000464842 035__ $$a(OCoLC)811371628
000464842 040__ $$aCaPaEBR$$cCaPaEBR
000464842 05014 $$aTK7871.85$$b.W65 2012eb
000464842 1001_ $$aWong, Terence K. S.
000464842 24510 $$aSemiconductor strain metrology$$h[electronic resource] :$$bprinciples and applications /$$cTerence K.S. Wong.
000464842 260__ $$a[Saif Zone, Sharjah, U.A.E] ;$$aOak Park, IL :$$bBentham Science,$$c[2012]
000464842 300__ $$a136 p. :$$bill.
000464842 504__ $$aIncludes bibliographical references and index.
000464842 506__ $$aAccess limited to authorized users.
000464842 650_0 $$aSemiconductors$$xDesign and construction$$xMaterials.
000464842 650_0 $$aCompound semiconductors$$xDesign and construction$$xMaterials.
000464842 650_0 $$aSilicon-on-insulator technology.
000464842 655_7 $$aElectronic books.$$2lcsh
000464842 852__ $$bebk
000464842 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10570978$$zOnline Access
000464842 909CO $$ooai:library.usi.edu:464842$$pGLOBAL_SET
000464842 980__ $$aEBOOK
000464842 980__ $$aBIB
000464842 982__ $$aEbook
000464842 983__ $$aOnline