000476627 000__ 01211cam\a2200325Ia\4500
000476627 001__ 476627
000476627 005__ 20210513165213.0
000476627 006__ m\\\\\o\\d\\\\\\\\
000476627 007__ cr\cn|||||||||
000476627 008__ 100903s2010\\\\maua\\\\ob\\\\001\0\eng\d
000476627 020__ $$z9781607839835 (hbk.)
000476627 035__ $$a(CaPaEBR)ebr10421850
000476627 035__ $$a(OCoLC)672322811
000476627 040__ $$aCaPaEBR$$cCaPaEBR
000476627 05014 $$aTK7874.7$$b.M67 2010eb
000476627 08204 $$a621.381548$$222
000476627 1001_ $$aMoreira, José,$$d1975-
000476627 24513 $$aAn engineer's guide to automated testing of high-speed interfaces$$h[electronic resource] /$$cJosé Moreira, Hubert Werkmann.
000476627 260__ $$aBoston :$$bArtech House,$$cc2010.
000476627 300__ $$axx, 566 p. :$$bill.
000476627 4901_ $$aArtech House microwave library
000476627 504__ $$aIncludes bibliographical references and index.
000476627 506__ $$aAccess limited to authorized users.
000476627 650_0 $$aVery high speed integrated circuits.
000476627 650_0 $$aAutomatic test equipment.
000476627 7001_ $$aWerkmann, Hubert.
000476627 830_0 $$aArtech House microwave library.
000476627 852__ $$bebk
000476627 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10421850$$zOnline Access
000476627 909CO $$ooai:library.usi.edu:476627$$pGLOBAL_SET
000476627 980__ $$aEBOOK
000476627 980__ $$aBIB
000476627 982__ $$aEbook
000476627 983__ $$aOnline