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000687136 008__ 121211s2012\\\\ohuad\\\ob\\\\101\0\eng\d
000687136 020__ $$z1615039791
000687136 020__ $$z9781615039791
000687136 020__ $$z9781615039951 $$qelectronic book
000687136 035__ $$a(CaPaEBR)ebr10627944
000687136 035__ $$a(OCoLC)823729131
000687136 040__ $$aCaPaEBR$$cCaPaEBR
000687136 05014 $$aTK7801$$b.I58 2012eb
000687136 1112_ $$aInternational Symposium for Testing and Failure Analysis$$n(38th :$$d2012 :$$cPhoenix Convention Center)
000687136 24510 $$aISTFA 2012$$h[electronic resource] :$$bconference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
000687136 260__ $$aMaterials Park, Ohio :$$bASM International,$$c2012.
000687136 300__ $$axxi, 620 p. :$$bill. (some col.)
000687136 504__ $$aIncludes bibliographical references and index.
000687136 506__ $$aAccess limited to authorized users.
000687136 650_0 $$aElectronics$$xMaterials$$xTesting$$vCongresses.
000687136 650_0 $$aElectronic apparatus and appliances$$xTesting$$vCongresses.
000687136 852__ $$bebk
000687136 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10627944$$zOnline Access
000687136 909CO $$ooai:library.usi.edu:687136$$pGLOBAL_SET
000687136 980__ $$aEBOOK
000687136 980__ $$aBIB
000687136 982__ $$aEbook
000687136 983__ $$aOnline