TY  - GEN
T1  - Scanning probe microscopy for industrial applications :nanomechanical characterization 
AU  - Yablon, Dalia G.,
CN  - TA417.23
ID  - 692097
KW  - Materials
KW  - Scanning probe microscopy
SN  - 9781118723142 
TI  - Scanning probe microscopy for industrial applications :nanomechanical characterization 
LK  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10788041
UR  - https://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10788041
ER  -