000692097 000__ 01587cam\a2200361\i\4500
000692097 001__ 692097
000692097 005__ 20210515093121.0
000692097 006__ m\\\\\o\\d\\\\\\\\
000692097 007__ cr\cn|||||||||
000692097 008__ 131107s2014\\\\njua\\\\ob\\\\001\0\eng\d
000692097 020__ $$z9781118288238
000692097 020__ $$a9781118723142 $$qelectronic book
000692097 035__ $$a(CaPaEBR)ebr10788041
000692097 035__ $$a(OCoLC)868954409
000692097 040__ $$aCaPaEBR$$beng$$erda$$epn$$cCaPaEBR
000692097 05014 $$aTA417.23$$b.S336 2014eb
000692097 08204 $$a620.1/127$$223
000692097 24500 $$aScanning probe microscopy for industrial applications :$$bnanomechanical characterization $$h[electronic resource]/$$cedited by Dalia G. Yablon.
000692097 264_1 $$aHoboken, New Jersey :$$bWiley,$$c2014.
000692097 264_4 $$c©2014
000692097 300__ $$a1 online resource (385 pages) :$$billustrations (some color), graphs
000692097 336__ $$atext$$2rdacontent
000692097 337__ $$acomputer$$2rdamedia
000692097 338__ $$aonline resource$$2rdacarrier
000692097 504__ $$aIncludes bibliographical references at the end of each chapters and index.
000692097 506__ $$aAccess limited to authorized users.
000692097 650_0 $$aMaterials$$xMicroscopy.
000692097 650_0 $$aScanning probe microscopy$$xIndustrial applications.
000692097 7001_ $$aYablon, Dalia G.,$$d1975-
000692097 77608 $$iPrint version:$$tScanning probe microscopy for industrial applications : nanomechanical characterization.$$dHoboken, New Jersey : Wiley, c2014 $$hxix, 347 pages $$z9781118288238 $$w2013009638
000692097 852__ $$bebk
000692097 85640 $$3ProQuest Ebook Central Academic Complete$$uhttps://univsouthin.idm.oclc.org/login?url=http://site.ebrary.com/lib/usiricelib/Doc?id=10788041$$zOnline Access
000692097 909CO $$ooai:library.usi.edu:692097$$pGLOBAL_SET
000692097 980__ $$aEBOOK
000692097 980__ $$aBIB
000692097 982__ $$aEbook
000692097 983__ $$aOnline