TY  - GEN
N2  - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.
AB  - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.
T1  - Trace-based post-silicon validation for VLSI circuits
DA  - c2014.
CY  - Cham ;
CY  - New York :
AU  - Liu, Xiao.
AU  - Xu, Qiang.
VL  - v.252
CN  - SpringerLink
CN  - TK7874
PB  - Springer,
PP  - Cham ;
PP  - New York :
PY  - c2014.
ID  - 695098
KW  - Integrated circuits
KW  - Integrated circuits
SN  - 9783319005331 
SN  - 3319005332 
TI  - Trace-based post-silicon validation for VLSI circuits
LK  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-319-00533-1
UR  - https://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-319-00533-1
ER  -