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000695098 020__ $$a9783319005331 $$qelectronic book
000695098 020__ $$a3319005332 $$qelectronic book
000695098 020__ $$z9783319005324
000695098 035__ $$aSP(OCoLC)ocn849904750
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000695098 049__ $$aISEA
000695098 050_4 $$aTK7874$$b.L58 2014eb
000695098 08204 $$a621.39/5$$223
000695098 1001_ $$aLiu, Xiao.
000695098 24510 $$aTrace-based post-silicon validation for VLSI circuits$$h[electronic resource] /$$cby Xiao Liu, Qiang Xu.
000695098 260__ $$aCham ;$$aNew York :$$bSpringer,$$cc2014.
000695098 300__ $$a1 online resource.
000695098 4901_ $$aLecture notes in electrical engineering,$$x1876-1100 ;$$vv.252
000695098 504__ $$aIncludes bibliographical references and index.
000695098 5050_ $$a1. Introduction -- 2. State of the art on post-silicon validation -- 3. Signal selection for visibility enhancement -- 4. Multiplexed tracing for design error -- 5. Tracing for electrical Error -- 6. Reusing test access mechanisms -- 7. Interconnection fabric for flexible tracing -- 8. Interconnection fabric for systematic tracing -- 9. Conclusion.
000695098 506__ $$aAccess limited to authorized users.
000695098 520__ $$aThis book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.
000695098 650_0 $$aIntegrated circuits$$xVery large scale integration$$xDesign and construction.
000695098 650_0 $$aIntegrated circuits$$xVerification.
000695098 7001_ $$aXu, Qiang.
000695098 830_0 $$aLecture notes in electrical engineering ;$$vv.252.
000695098 85280 $$bebk$$hSpringerLink
000695098 85640 $$3SpringerLink$$uhttps://univsouthin.idm.oclc.org/login?url=http://dx.doi.org/10.1007/978-3-319-00533-1$$zOnline Access
000695098 909CO $$ooai:library.usi.edu:695098$$pGLOBAL_SET
000695098 980__ $$aEBOOK
000695098 980__ $$aBIB
000695098 982__ $$aEbook
000695098 983__ $$aOnline
000695098 994__ $$a92$$bISE