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Trace-based post-silicon validation for VLSI circuits [electronic resource] / by Xiao Liu, Qiang Xu.

Liu, Xiao.; Xu, Qiang.
2014
TK7874 .L58 2014eb
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Title
Trace-based post-silicon validation for VLSI circuits [electronic resource] / by Xiao Liu, Qiang Xu.
Author
Liu, Xiao.
ISBN
9783319005331 electronic book
3319005332 electronic book
9783319005324
Publication Details
Cham ; New York : Springer, c2014.
Language
English
Description
1 online resource.
Call Number
TK7874 .L58 2014eb
Dewey Decimal Classification
621.39/5
Summary
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Added Author
Xu, Qiang.
Series
Lecture notes in electrical engineering ; v.252.
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1. Introduction
2. State of the art on post-silicon validation
3. Signal selection for visibility enhancement
4. Multiplexed tracing for design error
5. Tracing for electrical Error
6. Reusing test access mechanisms
7. Interconnection fabric for flexible tracing
8. Interconnection fabric for systematic tracing
9. Conclusion.

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